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CN Tech partner with DIP-View
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DIP-View are a pioneer in high resolution deflectometry for critical surfaces metrology applications. DIP-View are addressing multiple segments of the industrial markets such as automotive, semi-conductors, optics, etc., and they are now moving to industrial level and global markets.
D-Surface View
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- Vertical dynamic range 1 nm to 1mm
- Field of view up to 300mm
- Lateral resolution down to 10um
- Full diameter measurement of the sample without stitching 1 shot measurement
- Easy-to-use software interface
DIP-View are now a French DEEPTECH company!
DIP-View are now a French DEEPTECH company!
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BPI France has recognised the highly innovative technology brought by DIP-View for the 3D surface inspection market. DIP-View are now listed as a French DEEPTECH company and will be supported by BPI French innovation organisation to grow its business.
DIP-View presented D-Surface View at SEMICON Europe!
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DIP-View attended SEMICON Europe to present their latest technologies for 3D wafer inspection with disruptive capabilities. On display was their D-Surface View which provides a full static measurement of Bow, Warp, TTv, and LTv with dual wafer side capabilities up to 300mm. From mm to nm in one single shot!
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